Items where Author is "Caebergs, T"

Pétry, J and Boeck, B De and Sebaïhi, N and Coenegrachts, M and Caebergs, T and Dobre, M (2021) Uncertainty evaluation in atomic force microscopy measurement of nanoparticles based on statistical mixed model in a Bayesian framework. Measurement Science and Technology, 32 (8). 085008. ISSN 0957-0233